TIA TIA-526-4-A

OFSTP-4 Optical Eye Pattern Measurement Procedure

contributor author	TIA - Telecommunications Industry Association
date accessioned	2017-09-04T17:25:38Z
date available	2017-09-04T17:25:38Z
date copyright	35735
date issued	1997
identifier other	CHYXCAAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho47037D83FCDC49A961598F1EFDEC9FCD/handle/yse/148691
description abstract	This procedure describes a method of measuring the repetitive temporal characteristics of a two-level, intensity-modulated optical waveform (eye pattern) at an optical interface point. From the measured eye pattern, waveform parameters such as rise time, fall time, overshoot, and extinction ratio can be extracted. Alternatively, the waveform can be tested for compliance with a predetermined waveform mask. The primary components of the measurement system are a photodetector, a low-pass filter, and an oscilloscope, as shown in figure 1. The bandwidth and other characteristics of the low-pass filter depend on the application. Refer to product-specific documentation for the specification of the low-pass filter transfer function.
language	English
title	TIA TIA-526-4-A	num
title	OFSTP-4 Optical Eye Pattern Measurement Procedure	en
type	standard
page	27
status	Active
tree	TIA - Telecommunications Industry Association:;1997
contenttype	fulltext