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Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification - First Edition

contributor authorISO - International Organization for Standardization
date accessioned2017-09-04T18:49:59Z
date available2017-09-04T18:49:59Z
date copyright2004.03.15
date issued2004
identifier otherKTFYEBAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho47037D83FCDCAC426159DD6EFDEC9FCD/handle/yse/231289
languageEnglish
titleISO 16700num
titleMicrobeam analysis Scanning electron microscopy Guidelines for calibrating image magnification - First Editionen
typestandard
page24
statusActive
treeISO - International Organization for Standardization:;2004
contenttypefulltext


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