ISO 13424

Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis - First Edition

contributor author	ISO - International Organization for Standardization
date accessioned	2017-09-04T18:44:07Z
date available	2017-09-04T18:44:07Z
date copyright	2013.10.01
date issued	2013
identifier other	KDQIGFAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho47037DAVY%20-%206159DD6E273C9FCD0Facili/handle/yse/225475
description abstract	This International Standard specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle-resolved XPS, XPS sputter-depth profiling, peak-shape analysis, and variable photon energy XPS.
language	English
title	ISO 13424	num
title	Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis - First Edition	en
type	standard
page	54
status	Active
tree	ISO - International Organization for Standardization:;2013
contenttype	fulltext