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TP-110 Thermal Cycling Test Procedure for Electrical Connectors and Sockets

contributor authorECIA - Electronic Components Industry Association
date accessioned2017-09-04T16:37:03Z
date available2017-09-04T16:37:03Z
date copyright08/01/2006 (R 2013)
date issued2013
identifier otherBQVZBFAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho470393FD081D20686159DD6EFDEC9FCD0Facilities%20Engineering%20Command%226EFDEC9FCD/handle/yse/100578
description abstractThis standard establishes a test method to expose connectors and sockets to extremes of high and low temperatures at a specified ramp up and ramp down rate.
NOTE — If the ramp time between temperature extremes is ≤ 2.0 minutes, this test procedure shall not be used. The procedure as specified in EIA-364-32 (Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets) shall be performed as a substitute.
languageEnglish
titleECA EIA/ECA-364-110num
titleTP-110 Thermal Cycling Test Procedure for Electrical Connectors and Socketsen
typestandard
page12
statusActive
treeECIA - Electronic Components Industry Association:;2013
contenttypefulltext


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