ECA EIA/ECA-364-110
TP-110 Thermal Cycling Test Procedure for Electrical Connectors and Sockets
contributor author | ECIA - Electronic Components Industry Association | |
date accessioned | 2017-09-04T16:37:03Z | |
date available | 2017-09-04T16:37:03Z | |
date copyright | 08/01/2006 (R 2013) | |
date issued | 2013 | |
identifier other | BQVZBFAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;query=autho470393FD081D20686159DD6EFDEC9FCD0Facilities%20Engineering%20Command%226EFDEC9FCD/handle/yse/100578 | |
description abstract | This standard establishes a test method to expose connectors and sockets to extremes of high and low temperatures at a specified ramp up and ramp down rate. NOTE — If the ramp time between temperature extremes is ≤ 2.0 minutes, this test procedure shall not be used. The procedure as specified in EIA-364-32 (Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets) shall be performed as a substitute. | |
language | English | |
title | ECA EIA/ECA-364-110 | num |
title | TP-110 Thermal Cycling Test Procedure for Electrical Connectors and Sockets | en |
type | standard | |
page | 12 | |
status | Active | |
tree | ECIA - Electronic Components Industry Association:;2013 | |
contenttype | fulltext |