SMD-5962-96621 REV E

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON

contributor author	DLA - CC - DLA Land and Maritime
date accessioned	2017-09-04T18:47:56Z
date available	2017-09-04T18:47:56Z
date copyright	09/07/2005
date issued	2005
identifier other	KNOLIBAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho54037D839D40527361598F1EFDEC014A/handle/yse/229218
description abstract	This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class T, the user is encouraged to review the manufacturer's Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application. Intended Use: Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
language	English
title	SMD-5962-96621 REV E	num
title	MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON	en
type	standard
page	27
status	Active
tree	DLA - CC - DLA Land and Maritime:;2005
contenttype	fulltext