درباره ما
GSFC-S-311-44
SCREENING PROCEDURE FOR A SILICON DUAL N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (NDF9401)
| contributor author | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center | |
| date accessioned | 2017-09-04T17:56:08Z | |
| date available | 2017-09-04T17:56:08Z | |
| date copyright | 03/21/1975 | |
| date issued | 1975 | |
| identifier other | FLQZDAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=authoF237659669B749A96159DD6E273C9FCD/handle/yse/179280 | |
| language | English | |
| title | GSFC-S-311-44 | num |
| title | SCREENING PROCEDURE FOR A SILICON DUAL N-CHANNEL JUNCTION FIELD - EFFECT TRANSISTOR (NDF9401) | en |
| type | standard | |
| page | 9 | |
| status | Active | |
| tree | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1975 | |
| contenttype | fulltext |
