درباره ما
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
IEEE Std C62.59-2019
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2020-06-18T16:56:30Z | |
| date available | 2020-06-18T16:56:30Z | |
| date issued | 2019 | |
| identifier isbn | 978-1-5044-5824 | |
| identifier other | 08886679.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessioutho9193177793325273135A38A1095801/handle/yse/276509 | |
| description abstract | The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations, or network operators. | |
| language | English | |
| title | IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes | en |
| title | IEEE Std C62.59-2019 | num |
| type | Standard | |
| page | 41 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2019 | |
| contenttype | Fulltext | |
| subject keywords | IEEE C62.59 | |
| subject keywords | avalanche breakdown | |
| subject keywords | electrical characteristics | |
| subject keywords | surge protective component (SPC) | |
| subject keywords | punch-through | |
| subject keywords | electrical ratings | |
| subject keywords | foldback | |
| subject keywords | test methods | |
| subject keywords | forward conduction | |
| subject keywords | overvoltage protection | |
| subject keywords | Zener breakdown |
