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IEEE Std C57.168-2023

contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2024-12-17T08:08:46Z
date available2024-12-17T08:08:46Z
date copyright30 October 2023
date issued2023
identifier other10295425.pdf
identifier urihttp://yse.yabesh.ir/std;query=authoF23793FDFCDCAC426159DD6EFDEC014A/handle/yse/336277
description abstractProvided in this guide for low frequency dielectric testing for distribution, power, and regulating transformers are background on various low frequency test methods as well as guidance on how to conduct and interpret the results. Common pitfalls to avoid are presented along with compiled guidance on interpreting the results and possible methods for correcting test issues.
languageEnglish
publisherIEEE - The Institute of Electrical and Electronics Engineers, Inc.
titleIEEE Guide for Low-Frequency Dielectric Testing for Distribution, Power, and Regulating Transformersen
titleIEEE Std C57.168-2023num
typestandard
page38
statusActive
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2023
contenttypefulltext
subject keywordsdielectric frequency response
subject keywordsapplied
subject keywordstesting
subject keywordstransformer
subject keywordsdielectric test
subject keywordstroubleshooting
subject keywordstransformers
subject keywordslow-frequency test
subject keywordshi-pot
subject keywordsIEEE C57.168 induced
subject keywordsover excitation
subject keywordsauto-transformer
subject keywordsinsulation power factor
subject keywordsDFR
identifier DOI10.1109/IEEESTD.2023.10295425


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