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Dimensional Test Methods - Revision J

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T17:48:46Z
date available2017-09-04T17:48:46Z
date copyright02/01/2001
date issued2001
identifier otherERVWOCAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=authoF237ear369B7AC426159DD6EFDEC9FCD/handle/yse/171898
languageEnglish
titleIPC TM-650 2.2num
titleDimensional Test Methods - Revision Jen
typestandard
page1
statusActive
treeIPC - Association Connecting Electronics Industries:;2001
contenttypefulltext


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