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IPC 9261A

In-Process DPMO and Estimated Yield for PCAs

Organization:
IPC - Association Connecting Electronics Industries
Year: 2006

Abstract: This document defines standard methodologies for calculating defects per million opportunities (DPMO) metrics related to electronic printed board assembly processes. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912.
Additionally, a guide to defect categorization is provided that when used with J-STD-001 and IPC-A-610 can serve as a base for summarizing and reporting in-process defects.
Note: This document does not dictate the number of assemblies or data points needed to calculate DPMO metrics.
URI: http://yse.yabesh.ir/std;jse/handle/yse/176092
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    IPC 9261A

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contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T17:52:55Z
date available2017-09-04T17:52:55Z
date copyright38991
date issued2006
identifier otherFDDRXBAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;jse/handle/yse/176092
description abstractThis document defines standard methodologies for calculating defects per million opportunities (DPMO) metrics related to electronic printed board assembly processes. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912.
Additionally, a guide to defect categorization is provided that when used with J-STD-001 and IPC-A-610 can serve as a base for summarizing and reporting in-process defects.
Note: This document does not dictate the number of assemblies or data points needed to calculate DPMO metrics.
languageEnglish
titleIPC 9261Anum
titleIn-Process DPMO and Estimated Yield for PCAsen
typestandard
page24
statusActive
treeIPC - Association Connecting Electronics Industries:;2006
contenttypefulltext
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