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JEDEC JESD22-A108D
Temperature, Bias, and Operating Life
| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T16:41:52Z | |
| date available | 2017-09-04T16:41:52Z | |
| date copyright | 40483 | |
| date issued | 2010 | |
| identifier other | VQKSEDAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/105230 | |
| description abstract | This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices' operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortalityrelated failures. The detailed use and application of burn-in is outside the scope of this document. | |
| language | English | |
| title | JEDEC JESD22-A108D | num |
| title | Temperature, Bias, and Operating Life | en |
| type | standard | |
| page | 14 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2010 | |
| contenttype | fulltext |
