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JEDEC JESD89-2A
Test Method for Alpha Source Accelerated Soft Error Rate
| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T16:44:13Z | |
| date available | 2017-09-04T16:44:13Z | |
| date copyright | 39356 | |
| date issued | 2007 | |
| identifier other | VWOFBCAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/107560 | |
| description abstract | This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flipflops) by measuring the error rate while the device is irradiated by a characterized, solid alpha source. | |
| language | English | |
| title | JEDEC JESD89-2A | num |
| title | Test Method for Alpha Source Accelerated Soft Error Rate | en |
| type | standard | |
| page | 14 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2007 | |
| contenttype | fulltext | |
| subject keywords | alpha | |
| subject keywords | americium | |
| subject keywords | hardness | |
| subject keywords | radiation | |
| subject keywords | SER | |
| subject keywords | soft error | |
| subject keywords | thorium |
