JEDEC JESD22-A100C

Cycled Temperature-Humidity-Bias Life Test

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T16:52:38Z
date available	2017-09-04T16:52:38Z
date copyright	39356
date issued	2007
identifier other	BVBDBCAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/116190
description abstract	The Cycled Temperature-humidity-bias Life Test is performed for the purpose of evaluating the reliability of nonhermetic packaged solid state devices in humid environments. It employs conditions of temperature cycling, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors that pass through it. The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages (e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 or JESD22-A110.
language	English
title	JEDEC JESD22-A100C	num
title	Cycled Temperature-Humidity-Bias Life Test	en
type	standard
page	12
status	Active
tree	JEDEC - Solid State Technology Association:;2007
contenttype	fulltext
subject keywords	Bias Life
subject keywords	Cavity
subject keywords	Humidity
subject keywords	Lidded Ceramic
subject keywords	MQUAD
subject keywords	Temperature Cycling
subject keywords	Test Method - Cycled Temperature Humidity