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Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices

contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T16:55:44Z
date available2017-09-04T16:55:44Z
date copyright38991
date issued2006
identifier otherXCATJBAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/119187
description abstractThis specification defines the standard requirements and procedures for terrestrial soft-error-rate (SER)testing of integrated circuits and reporting of results. Both real-time (unaccelerated) and acceleratedtesting procedures are described. At terrestrial, Earth-based altitudes, the predominant sources of radiation include both cosmic-ray radiation and alpha-particle radiation from radioisotopic impurities in the package and chip materials. An overall assessment of a deviceÂ's SER is complete, only when an unaccelerated test is done, or accelerated SER data for the alpha-particle component and the cosmic-radiation component has been obtained.
languageEnglish
titleJEDEC JESD89Anum
titleMeasurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devicesen
typestandard
page94
statusActive
treeJEDEC - Solid State Technology Association:;2006
contenttypefulltext
subject keywordsAlpha Particles
subject keywordsCosmic Rays
subject keywordsSoft Error Rate
subject keywordsTerrestrial


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