JEDEC JESD22-A104D

Temperature Cycling

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T16:59:02Z
date available	2017-09-04T16:59:02Z
date copyright	03/01/2009
date issued	2009
identifier other	XKROLCAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;jse/handle/yse/122414
description abstract	This standard provides a method for determining solid state devices capability to withstand extreme temperature cycling. Changes in this revision include requirements that the worst-case load temperature must reach the specific extremes rather than just requiring that the chamber ambient temperature reach the extremes. This ensures that the test specimens will reach the specified temperature extremes regardless of chamber loading. Definitions are provided for Load, Monitoring Sensor, Worst-Case Load Temperature, and Working Zone. The transfer time has been tightened from 5 minutes to 1 minute. Five new test conditions have been added as well as a caution on test conditions which exceed the glass transition temperature of plastic package solid devices.
language	English
title	JEDEC JESD22-A104D	num
title	Temperature Cycling	en
type	standard
page	18
status	Active
tree	JEDEC - Solid State Technology Association:;2009
contenttype	fulltext
subject keywords	Reliability Models
subject keywords	Temperature Cycling
subject keywords	Test Method - Temperature Cycling