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JEDEC JESD531
Thermal Resistance Test Method for Signal and Regulator Diodes (Forward Voltage, Switching Method) - Reaffirmation of ANSI/EIA-531-1986, Previously Published as IS-13; Replaces JEDEC JEP 90
| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T17:17:41Z | |
| date available | 2017-09-04T17:17:41Z | |
| date copyright | 07/01/1986 (R 2002) | |
| date issued | 2002 | |
| identifier other | ZIVXCBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/141025 | |
| description abstract | This standard describes a test method for measuring the thermal resistance of signal and regulator diodes. The need for modification of this test method arose out of the limited description that existed earlier for both signal and regulator diode applications in testing for thermal resistance. Previously published as ID-13. ANSI/EIA-531-1986 (July) expired June 1996. Became JESD531 after reaffirmation April 2002. | |
| language | English | |
| title | JEDEC JESD531 | num |
| title | Thermal Resistance Test Method for Signal and Regulator Diodes (Forward Voltage, Switching Method) - Reaffirmation of ANSI/EIA-531-1986, Previously Published as IS-13; Replaces JEDEC JEP 90 | en |
| type | standard | |
| page | 21 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2002 | |
| contenttype | fulltext | |
| subject keywords | Diodes - Signal and Regulator | |
| subject keywords | Forward Voltage | |
| subject keywords | Signal Diodes | |
| subject keywords | Switching Method | |
| subject keywords | Thermal Resistance |
