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Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM)

contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T16:20:23Z
date available2017-09-04T16:20:23Z
date copyright04/01/1995 (R 2008)
date issued2008
identifier otherTKQHMCAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/83799
description abstractThis standard was revised to clarify assumptions necessary to estimate AOQ, revise the minimum sample size algorithm, address small sample size concerns, and provide methods for combining groups for AOQ estimation. Derivation of any new methods for combing groups for AOQ estimation. Derivation of any new methods introduced into this document have been provided in annexes. A statistical method is based on confidence interval statistics. A procedure was established for reporting AOQ when the minimum sample size criterion is not met. Not all sections of EIA-554 are appropriate for use by device manufacturers therefore JEDEC wishes to continue using JESD16A. In December 2008 the formulating committee approved to remove EIA-554 (July 1996, Reaffirmed September 2002) from the JEDEC website. To obtain a copy of EIA-554 please contact GEIA at http://www.geia.org/  
languageEnglish
titleJEDEC JESD16-Anum
titleAssessment of Average Outgoing Quality Levels in Parts Per Million (PPM)en
typestandard
page40
statusActive
treeJEDEC - Solid State Technology Association:;2008
contenttypefulltext
subject keywordsAssessment - Average Outgoing Quality
subject keywordsAverage Outgoing Quality
subject keywordsEIA-554
subject keywordsParts Per Million (PPM) - Quality Assessment
subject keywordsQuality Levels - Outgoing


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