Show simple item record

Method for Developing Acceleration Models for Electronic Component Failure Mechanisms

contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T16:35:13Z
date available2017-09-04T16:35:13Z
date copyright08/01/2003 (R 2011)
date issued2011
identifier otherUZJBIEAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/98686
description abstractThe method described in this document applies to all reliability mechanisms associated with electronic components.
The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic components.
languageEnglish
titleJEDEC JESD91Anum
titleMethod for Developing Acceleration Models for Electronic Component Failure Mechanismsen
typestandard
page20
statusActive
treeJEDEC - Solid State Technology Association:;2011
contenttypefulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record