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IEC 62884-3
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods - Edition 1.0
| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2018-07-31T09:58:35Z | |
| date available | 2018-07-31T09:58:35Z | |
| date copyright | 2018.03.01 | |
| date issued | 2018 | |
| identifier other | RLOXEGAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessionid=31064A12890E9/handle/yse/264683 | |
| description abstract | This part of IEC 62884 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions. | |
| language | English | |
| title | IEC 62884-3 | num |
| title | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods - Edition 1.0 | en |
| type | standard | |
| page | 18 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2018 | |
| contenttype | fulltext |
