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IEC 62153-4-7

|French -- Méthodes d'essai des câbles métalliques de communication – Partie 4-7: Compatibilité électromagnétique (CEM) – Méthode d'essai pour mesurer l'impédance de transfert ZT et l'affaiblissement d'écrantage as ou l'affaiblissement de couplage aC des

Organization:
IEC - International Electrotechnical Commission
Year: 2018

Abstract: This triaxial method is suitable to determine the surface transfer impedance and/or screening attenuation and coupling attenuation of mated screened connectors (including the connection between cable and connector) and cable assemblies. This method could also be extended to determine the transfer impedance, coupling or screening attenuation of balanced or multipin connectors and multicore cable assemblies. For the measurement of transfer impedance and screening- or coupling attenuation, only one test set-up is needed.
URI: http://yse.yabesh.ir/std;quessionid=31064A12890E9/handle/yse/264745
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    IEC 62153-4-7

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contributor authorIEC - International Electrotechnical Commission
date accessioned2018-07-31T09:58:40Z
date available2018-07-31T09:58:40Z
date copyright2018.05.01
date issued2018
identifier otherTOPDFGAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;quessionid=31064A12890E9/handle/yse/264745
description abstractThis triaxial method is suitable to determine the surface transfer impedance and/or screening attenuation and coupling attenuation of mated screened connectors (including the connection between cable and connector) and cable assemblies. This method could also be extended to determine the transfer impedance, coupling or screening attenuation of balanced or multipin connectors and multicore cable assemblies. For the measurement of transfer impedance and screening- or coupling attenuation, only one test set-up is needed.
languageEnglish
languageFrench
titleIEC 62153-4-7num
title|French -- Méthodes d'essai des câbles métalliques de communication – Partie 4-7: Compatibilité électromagnétique (CEM) – Méthode d'essai pour mesurer l'impédance de transfert ZT et l'affaiblissement d'écrantage as ou l'affaiblissement de couplage aC desen
typestandard
page186
statusActive
treeIEC - International Electrotechnical Commission:;2018
contenttypefulltext
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