JEDEC JEP179
Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface- Mount Components
| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T16:57:37Z | |
| date available | 2017-09-04T16:57:37Z | |
| date copyright | 06/01/2006 | |
| date issued | 2006 | |
| identifier other | XHGGJBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessionid=4703-Sta081D206/handle/yse/121152 | |
| description abstract | The purpose of this document is to explain the meaning of SPD setting (JESD21 SPD section) for DDR2 SDRAM (JESD79-2) in normal and extended temperature operationy67. | |
| language | English | |
| title | JEDEC JEP179 | num |
| title | Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface- Mount Components | en |
| type | standard | |
| page | 10 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2006 | |
| contenttype | fulltext | |
| subject keywords | DDR2 | |
| subject keywords | Refresh Operation | |
| subject keywords | SPD | |
| subject keywords | Temperature Range |

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