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IEEE Recommended Practice for Statistical Process Control for EMC Test Laboratories
IEEE Std 2665-2022
Year: 2023
Abstract: Guidance is provided on how to verify electromagnetic compatibility (EMC) test performance through the use of statistical process control (SPC) and examples of setups. Employing SPC, the validity of tests can be monitored by a laboratory by recording data in such a way that trends are detectable, and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence, to both the laboratory and its customer, that test results will be correct.
Subject: Walter Shewhart
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Statistics
IEEE Recommended Practice for Statistical Process Control for EMC Test Laboratories
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| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2023-08-07T18:46:19Z | |
| date available | 2023-08-07T18:46:19Z | |
| date copyright | 27 January 2023 | |
| date issued | 2023 | |
| identifier other | 10025652.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessioutho4703177793325273135A68A10958014A0F/handle/yse/329555 | |
| description abstract | Guidance is provided on how to verify electromagnetic compatibility (EMC) test performance through the use of statistical process control (SPC) and examples of setups. Employing SPC, the validity of tests can be monitored by a laboratory by recording data in such a way that trends are detectable, and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence, to both the laboratory and its customer, that test results will be correct. | |
| language | English | |
| title | IEEE Recommended Practice for Statistical Process Control for EMC Test Laboratories | en |
| title | IEEE Std 2665-2022 | num |
| type | Standard | |
| page | 42 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2023 | |
| contenttype | Fulltext | |
| subject keywords | Walter Shewhart | |
| subject keywords | individual moving range | |
| subject keywords | statistical process control | |
| subject keywords | EMC | |
| subject keywords | control limits | |
| subject keywords | detection rules | |
| subject keywords | IEEE 2665 | |
| subject keywords | electromagnetic compatibility | |
| subject keywords | XmR chart | |
| subject keywords | SPC | |
| subject keywords | quality check | |
| identifier DOI | 10.1109/IEEESTD.2023.10025652 |