Show simple item record

BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope

BS ISO 25387

contributor authorBSI - British Standards Institution
date accessioned2025-09-30T21:46:44Z
date available2025-09-30T21:46:44Z
date copyright18 July 2025
date issued2025
identifier isbn-
identifier other000000000030505052.pdf
identifier urihttp://yse.yabesh.ir/std;quessioutho4703177793325273135A68A10958014A0Fa/handle/yse/346861
languageEnglish
publisherBSI - British Standards Institution
titleBS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscopeen
titleBS ISO 25387num
typeStandard
page60
statusCurrent
treeBSI - British Standards Institution:;2025
contenttypeFulltext


Files in this item

Thumbnail
Name:
000000000030505052.pdf
Size:
10.56Mb
Format:
PDF
View/Open

This item appears in the following Collection(s)

Show simple item record