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IEEE 1671.6
Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-09-04T16:49:14Z | |
| date available | 2017-09-04T16:49:14Z | |
| date copyright | 09/26/2008 | |
| date issued | 2008 | |
| identifier other | WKJLLCAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/112699 | |
| language | English | |
| title | IEEE 1671.6 | num |
| title | Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information | en |
| type | standard | |
| page | 30 | |
| status | Active | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2008 | |
| contenttype | fulltext |
