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SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, N-CHANNEL, SILICON, TYPES 2N7500U5, 2N7501U5, AND 2N7502U5, JANTXVR AND JANSR

contributor authorDLA - CC - DLA Land and Maritime
date accessioned2017-09-04T17:13:14Z
date available2017-09-04T17:13:14Z
date copyright03/17/2011
date issued2011
identifier otherYXNKEEAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/136697
description abstractThis specification covers the performance requirements for a N-Channel, enhancement-mode, MOSFET, radiation hardened (total dose and Single Event Effects (SEE)), power transistor. Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500, with avalanche energy maximum rating (EAS) and maximum avalanche current (IAS). Intended Use: Semiconductors conforming to this specification are intended for original equipment design applications and logistic support of existing equipment.
languageEnglish
titleMIL-PRF-19500/707Bnum
titleSEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, N-CHANNEL, SILICON, TYPES 2N7500U5, 2N7501U5, AND 2N7502U5, JANTXVR AND JANSRen
typestandard
page24
statusActive
treeDLA - CC - DLA Land and Maritime:;2011
contenttypefulltext


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