IEEE 1620

Abstract

Foreword<br>This standard covers recommended methods and standardized reporting practices for electrical characterization of organic transistors. Due to the nature of organic transistors, significant measurement errors can be introduced if not properly addressed. This standard describes the most common sources of measurement error, and gives recommended practices in order to minimize and/or characterize the effect of each.<br>Standard reporting practices are included in order to minimize confusion in analyzing reported data. Disclosure of environmental conditions and sample size are included so that results can be appropriately assessed by the research community. These reporting practices also support repeatability of results, so that new discoveries may be confirmed more efficiently.<br>The practices in this standard were compiled from research and industry organizations developing organic transistor devices, materials, and manufacturing techniques. These practices were based on standard operating procedures utilized in laboratories worldwide.<br>This standard was initiated in 2002 to facilitate the evolution of organic transistors from the laboratory into a sustainable industry. Standardized characterization methods and reporting practices creates a means of effective comparison of information and a foundation for manufacturing readiness.<br>Scope&#160;<br>This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.