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SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED TRANSISTOR, N-CHANNEL, SILICON, TYPES 2N7475T1, 2N7476T1, AND 2N7477T1 (TOTAL DOSE AND SINGLE EVENT EFFECTS), JANTXVR AND JANSR

contributor authorDLA - CC - DLA Land and Maritime
date accessioned2017-09-04T17:38:40Z
date available2017-09-04T17:38:40Z
date copyright05/06/2013
date issued2013
identifier otherDQOBDFAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/161619
description abstractThis specification covers the performance requirements for N-Channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistors, with avalanche energy maximum rating (EAS) and maximum avalanche current (IAS). Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500. See 6.5 for JANHC and JANKC die versions.Intended Use: Semiconductors conforming to this specification are intended for original equipment design applications and logistic support of existing equipment.
languageEnglish
titleMIL-PRF-19500/685Fnum
titleSEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED TRANSISTOR, N-CHANNEL, SILICON, TYPES 2N7475T1, 2N7476T1, AND 2N7477T1 (TOTAL DOSE AND SINGLE EVENT EFFECTS), JANTXVR AND JANSRen
typestandard
page23
statusActive
treeDLA - CC - DLA Land and Maritime:;2013
contenttypefulltext


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