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RISJEDEC JESD221: Alpha Radiation Measurement in Electronic Materials
Abstract: This standard applies generally to gas proportional instruments and the use thereof in measuring materials with an alpha emissivity of less than 10 ·khr-1·cm-2. The primary focus ...
JEDEC JESD31D: General Requirements for Distributors of Commercial and Military Semiconductor Devices
Abstract: This publication identifies the general requirements for Distributors that supply Commercial and Military products. This standard applies to all discrete semiconductors, integrated circuits and Hybrids, whether packaged ...
JEDEC JESD72: Test Methods and Acceptance Procedures for the Evaluation of Polymeric Materials
Abstract: This Test Method covers the minimum requirements that should be in effect for the evaluation and acceptance of polymeric materials for use in industrial, military, space, and other special-condition products which may ...
JEDEC JESD51-5: Extension of Thermal Test Board Standards for Packages with Direct Thermal Attachment Mechanisms
Abstract: This extension of the thermal standards provides a standard fixture for direct attach type packages such as deep-downset of thermally tabbed packages. This specification provides additional design detail for use in developing ...
JEDEC JESD73-4: 7Standard for Description of 3867: 2.5 V, Dual 5-Bit, 2-Port, DDR FET Switch
Abstract: This standard provides a set of uniform data sheet parameters for the description of a dual 5-bit, 2.5 V FET transmission-gate bus switch device for DDR memory module and motherboard applications. This bus switch device ...
JEDEC JESD82-19A: Definition of the SSTUA32S865 DDR2 RDIMM Applications Registered Buffer with Parity for and SSTUA32D865 28-bit 1:2
Abstract: This standard defines standard specifications of dc interface parameters, switching parameters, and test loading for definition of the SSTUA32S865 and SSTUA32D865 registered buffer with parity for 2 rank by 4 or similar ...
JEDEC JESD82-8.01: Standard for Definition of CU877 PLL Clock Driver for Registered DDR2 DIMM Applications
Abstract: This standard defines standard specifications of dc interface parameters, switching parameters, and test loading for definition of a Â'CU877 PLL clock device for registered DDR2 DIMM applications. The purpose is to ...
JEDEC JESD340: Standard for the Measurement of CRE
Abstract: INTRODUCTION
This standard offers an easily-measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The ...
This standard offers an easily-measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The ...
JEDEC JESD209B: Low Power Double Data Rate (LPDDR) SDRAM Standard
Abstract: This standard defines the Low Power Double Data Rate (LPDDR) SDRAM, including features, functionality, AC and DC characteristics, packages, and pin assignments. This scope may be expanded in future to also include other ...
JEDEC JESD76-2: Standard Description of 1.2 V CMOS Logic Devices (Normal Range Operations)
Abstract: This standard defines dc interface, switching parameters and test loading for digital logic devices based on 1.2 V (normal range) power supply levels. The purpose is to provide a standard specification for uniformity, ...