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NASA-LLIS-0989

Lessons Learned – ETU Laser Diode Pump Array Failure - Indium gasket short between contacts caused electrical failure

contributor authorNASA - National Aeronautics and Space Administration (NASA)
date accessioned2017-09-04T15:18:01Z
date available2017-09-04T15:18:01Z
date copyright37166
date issued2001
identifier otherMOUEQCAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/17547
description abstractDescription of Driving Event:
The ETU Laser for GLAS started showing signs of failing to lase. Initial failure investigations pointed to the laser Oscillator Diode. A detailed investigation disclosed that the cause of the short was an indium bridge within a screw hole in the pump array. In the diode pump array, the manufacturer uses a thin indium gasket to assure good thermal conductivity from the diode bar to the diode bar mount. The assembly torque used on the screws of this diode and the repeated assembly and disassembly of this particular diode stack caused the indium gasket to bridge/creep (smear across) the insulator. Basically, there were insufficient clearances around the holes in the indium gasket to allow proper alignment of the gasket to hole interface given that the indium will flow under pressure.
languageEnglish
titleNASA-LLIS-0989num
titleLessons Learned – ETU Laser Diode Pump Array Failure - Indium gasket short between contacts caused electrical failureen
typestandard
page2
statusActive
treeNASA - National Aeronautics and Space Administration (NASA):;2001
contenttypefulltext
subject keywordsConfiguration Management
subject keywordsFlight Equipment
subject keywordsHardware
subject keywordsParts Materials & Processes
subject keywordsRisk Management/Assessment
subject keywordsSafety & Mission Assurance
subject keywordsSpacecraft
subject keywordsTest & Verification


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