IEEE 716
Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-09-04T18:18:21Z | |
| date available | 2017-09-04T18:18:21Z | |
| date copyright | 03/16/1995 (R 2011) | |
| date issued | 2011 | |
| identifier other | HRGUDFAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/201086 | |
| description abstract | Scope and purpose IEEE Std 716-1995 defines a high order language for testing. This language is designed to describe tests in terms that are independent of any specific test system. It has been constrained to ensure that it can be implemented on automatic test equipment. This document defines an operational standard that was originally based upon the language defined by the reference document for the ATLAS language, IEEE Std 416-1984, in that, for those cases where a capability was required that went beyond the existing reference document and working papers, or it was not possible to conveniently subset the 416 material, extensions were developed for IEEE Standard 716. | |
| language | English | |
| title | IEEE 716 | num |
| title | Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS) | en |
| type | standard | |
| page | 606 | |
| status | Active | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2011 | |
| contenttype | fulltext |

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