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MICROCIRCUIT DIE, MEMORY, DIGITAL, CMOS, 4M X 1 DYNAMIC RANDOM ACCESS MEMORY (DRAM), MONOLITHIC SILICON

contributor authorDLA - CC - DLA Land and Maritime
date accessioned2017-09-04T18:20:18Z
date available2017-09-04T18:20:18Z
date copyright04/05/2006
date issued2006
identifier otherHWBBJBAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/202904
description abstractThis drawing establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535 and the manufacturers approved QM plan for use in monolithic microcircuits, multichip modules (MCMs), hybrids, electronic modules, or devices using chip and wire designs in accordance with MIL-PRF-38534 are specified herein. Two product assurance classes consisting of military high-reliability (device class Q) and space application (device class V) are reflected in the Part or Identification Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels shall be reflected in the PIN.Intended Use: Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for Government microcircuit applications (original equipment), design applications, and logistics purposes.
languageEnglish
titleSMD-5962-96889 REV Anum
titleMICROCIRCUIT DIE, MEMORY, DIGITAL, CMOS, 4M X 1 DYNAMIC RANDOM ACCESS MEMORY (DRAM), MONOLITHIC SILICONen
typestandard
page22
statusActive
treeDLA - CC - DLA Land and Maritime:;2006
contenttypefulltext


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