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IEEE 1658
Terminology and Test Methods of Digital-to-Analog Converter Devices
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-09-04T18:22:33Z | |
| date available | 2017-09-04T18:22:33Z | |
| date copyright | 40847 | |
| date issued | 2011 | |
| identifier other | IBSHUEAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/204981 | |
| description abstract | This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs). It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs. Purpose This standard is written to clear up confusion relating to the terms and definitions concerning DACs. Test methods are defined with expected output and analysis of the data generated from these test methods. Product specifications are defined in clear terms that will be understandable by all international users and manufacturers. | |
| language | English | |
| title | IEEE 1658 | num |
| title | Terminology and Test Methods of Digital-to-Analog Converter Devices | en |
| type | standard | |
| page | 126 | |
| status | Active | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2011 | |
| contenttype | fulltext | |
| subject keywords | DAC | |
| subject keywords | digital-to-analog converter | |
| subject keywords | IEEE 1658 | |
| subject keywords | SFDR | |
| subject keywords | SNR | |
| subject keywords | spectrum | |
| subject keywords | test methods | |
| subject keywords | test terminology |
