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IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description
IEC 61671-5 Edition 1.0 2016-04
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-10-28T13:01:48Z | |
| date available | 2017-10-28T13:01:48Z | |
| date copyright | 8 April 2016 | |
| date issued | 2016 | |
| identifier other | 7454658.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/240396 | |
| description abstract | An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test. | |
| language | English | |
| title | IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description | en |
| title | IEC 61671-5 Edition 1.0 2016-04 | num |
| type | standard | |
| page | 32 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2016 | |
| contenttype | fulltext | |
| subject keywords | interface device (ID) | |
| subject keywords | IEEE 1671.5(TM) | |
| subject keywords | test adapter | |
| subject keywords | automatic test system (ATS) | |
| subject keywords | XML schema | |
| subject keywords | automatic test markup language (ATML) | |
| subject keywords | interface test adapter (ITA) | |
| subject keywords | ATML instance document | |
| subject keywords | test fixture | |
| subject keywords | automatic test equipment (ATE) | |
| identifier DOI | 10.1109/IEEESTD.2016.7454658 |
