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IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
IEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003)
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-10-28T13:02:17Z | |
| date available | 2017-10-28T13:02:17Z | |
| date copyright | 18 March 2016 | |
| date issued | 2016 | |
| identifier other | 7436703.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/240492 | |
| description abstract | IEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems. | |
| language | English | |
| title | IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks | en |
| title | IEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003) | num |
| type | standard | |
| page | 230 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2016 | |
| contenttype | fulltext | |
| subject keywords | integrated circuits | |
| subject keywords | IEEE 1149.6(TM) | |
| subject keywords | differential signaling | |
| subject keywords | ac-coupled signaling | |
| subject keywords | interconnect test | |
| subject keywords | circuit boards | |
| subject keywords | boundary scan | |
| subject keywords | printed circuit boards | |
| subject keywords | test | |
| identifier DOI | 10.1109/IEEESTD.2016.7436703 |
