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IEEE Standard for Digital Test Interchange Format (DTIF)
IEEE Std 1445-2016 (Revision of IEEE Std 1445-1998)
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-10-28T13:02:21Z | |
| date available | 2017-10-28T13:02:21Z | |
| date copyright | 27 Jan. 2017 | |
| date issued | 2017 | |
| identifier other | 7837032.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/240501 | |
| description abstract | The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe. | |
| language | English | |
| title | IEEE Standard for Digital Test Interchange Format (DTIF) | en |
| title | IEEE Std 1445-2016 (Revision of IEEE Std 1445-1998) | num |
| type | standard | |
| page | 64 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2017 | |
| contenttype | fulltext | |
| subject keywords | fault dictionary data | |
| subject keywords | ATE | |
| subject keywords | DTIF | |
| subject keywords | DATPG | |
| subject keywords | IEEE 1445(TM) | |
| subject keywords | digital test interchange format | |
| subject keywords | automatic test equipment | |
| subject keywords | digital automated test program generator | |
| identifier DOI | 10.1109/IEEESTD.2017.7837032 |
