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IEEE Std 1450.4-2017

contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2018-07-30T06:09:54Z
date available2018-07-30T06:09:54Z
date copyrightFeb. 9 2018
date issued2018
identifier isbn9781504446433
identifier other08283877.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/258410
description abstractIEEE Std 1450â„¢-1999, which specifies the Standard Test Interface Language (STIL), is extended by this standard to provide an interface between test generation tools and test equipment with regard to the specification of the flow of execution of test program components. It defines structures so that test flows, sub-flows, and binning may be described in a manner that facilitates automated generation, modification, and/or manual maintenance and, although not yet a complete run-time test language, execution on automated test equipment (ATE). It also defines an interface between tester configurations (described by IEEE Std 1450-1999 and IEEE Std 1450.2â„¢-2002) and test program components. It also defines a hierarchy of flows, sub-flows, and test components as well as structures for defining flow-related variables and processing expressions involving those variables. It provides structures that support automatic test program generation (ATPRG) and translation and that support running it natively as an ATE programming language. As an adjunct, IEEE Std 1450.3â„¢-2007 may be used by ATPRG for tester rules checking.
languageEnglish
titleIEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specificationen
titleIEEE Std 1450.4-2017num
typestandard
page190
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2018
contenttypefulltext
subject keywordsATPG
subject keywordsATPRG
subject keywordsCAE
subject keywordsDUT
subject keywordsIC test
subject keywordsIEEE 1450.4(TM)
subject keywordsTPG
subject keywordsautomatic test program generator or generation
subject keywordsbinning
subject keywordscomputer-aided engineering
subject keywordsdevice under test
subject keywordsintegrated circuit test
subject keywordstest flow
subject keywordstest program description
subject keywordstest program language
subject keywordsAutomatic testing
subject keywordsComputer aided engineering
subject keywordsIEEE Standards
subject keywordsIntegrated circuits
subject keywordsProgramming
subject keywordsIEEE standards
subject keywordsautomatic test equipment
subject keywordsautomatic test software
subject keywordsautomatic testing
subject keywordselectronic equipment testing
subject keywordsprogram testing
subject keywordsIEEE Standard
subject keywordsIEEE Std 1450â„¢-1999
subject keywordsIEEE Std 1450-1999
subject keywordsStandard Test Interface Language
subject keywordsTest flow specification
subject keywordsautomated test equipment
subject keywordscomplete run-time test language
subject keywordsdefining flow-related variables
subject keywordstest generation tools
subject keywordstest program components
identifier DOI10.1109/IEEESTD.2018.8283877


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