IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification
IEEE Std 1450.4-2017
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2018-07-30T06:09:54Z | |
| date available | 2018-07-30T06:09:54Z | |
| date copyright | Feb. 9 2018 | |
| date issued | 2018 | |
| identifier isbn | 9781504446433 | |
| identifier other | 08283877.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/258410 | |
| description abstract | IEEE Std 1450â„¢-1999, which specifies the Standard Test Interface Language (STIL), is extended by this standard to provide an interface between test generation tools and test equipment with regard to the specification of the flow of execution of test program components. It defines structures so that test flows, sub-flows, and binning may be described in a manner that facilitates automated generation, modification, and/or manual maintenance and, although not yet a complete run-time test language, execution on automated test equipment (ATE). It also defines an interface between tester configurations (described by IEEE Std 1450-1999 and IEEE Std 1450.2â„¢-2002) and test program components. It also defines a hierarchy of flows, sub-flows, and test components as well as structures for defining flow-related variables and processing expressions involving those variables. It provides structures that support automatic test program generation (ATPRG) and translation and that support running it natively as an ATE programming language. As an adjunct, IEEE Std 1450.3â„¢-2007 may be used by ATPRG for tester rules checking. | |
| language | English | |
| title | IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification | en |
| title | IEEE Std 1450.4-2017 | num |
| type | standard | |
| page | 190 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2018 | |
| contenttype | fulltext | |
| subject keywords | ATPG | |
| subject keywords | ATPRG | |
| subject keywords | CAE | |
| subject keywords | DUT | |
| subject keywords | IC test | |
| subject keywords | IEEE 1450.4(TM) | |
| subject keywords | TPG | |
| subject keywords | automatic test program generator or generation | |
| subject keywords | binning | |
| subject keywords | computer-aided engineering | |
| subject keywords | device under test | |
| subject keywords | integrated circuit test | |
| subject keywords | test flow | |
| subject keywords | test program description | |
| subject keywords | test program language | |
| subject keywords | Automatic testing | |
| subject keywords | Computer aided engineering | |
| subject keywords | IEEE Standards | |
| subject keywords | Integrated circuits | |
| subject keywords | Programming | |
| subject keywords | IEEE standards | |
| subject keywords | automatic test equipment | |
| subject keywords | automatic test software | |
| subject keywords | automatic testing | |
| subject keywords | electronic equipment testing | |
| subject keywords | program testing | |
| subject keywords | IEEE Standard | |
| subject keywords | IEEE Std 1450â„¢-1999 | |
| subject keywords | IEEE Std 1450-1999 | |
| subject keywords | Standard Test Interface Language | |
| subject keywords | Test flow specification | |
| subject keywords | automated test equipment | |
| subject keywords | complete run-time test language | |
| subject keywords | defining flow-related variables | |
| subject keywords | test generation tools | |
| subject keywords | test program components | |
| identifier DOI | 10.1109/IEEESTD.2018.8283877 |

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