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IEEE Std 1076.1-2017 (Revision of IEEE Std 1076.1-2007)

contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2018-07-30T06:10:02Z
date available2018-07-30T06:10:02Z
date copyrightJan. 26 2018
date issued2018
identifier isbn9781504442671
identifier other08267464.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/258458
description abstractThe IEEE 1076.1 language, a hardware description language for the description and the simulation of analog, digital, and mixed-signal systems, is defined in this standard. The language, also informally known as VHDL-AMS, is built on IEEE Std 1076-2008 (VHDL) and extends it with additions and changes to provide capabilities of writing and simulating analog and mixed-signal models. (Additional downloadable files are available for this standard at http://standards.ieee.org/downloads/1076/1076.1-2017/).
languageEnglish
titleIEEE Standard VHDL Analog and Mixed-Signal Extensionsen
titleIEEE Std 1076.1-2017 (Revision of IEEE Std 1076.1-2007)num
typestandard
page672
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2018
contenttypefulltext
subject keywordsIEEE 1076(TM)
subject keywordsIEEE 1076.1(TM)
subject keywordsVHD
subject keywordsanalog design
subject keywordscomputer
subject keywordscomputer languages
subject keywordshardware design
subject keywordsmixed-signal design
subject keywordsCompanies
subject keywordsComputational modeling
subject keywordsDesign automation
subject keywordsHardware
subject keywordsIEEE Standards
subject keywordsTrademarks
subject keywordsIEEE standards
subject keywordshardware description languages
subject keywordsmixed analogue-digital integrated circuits
subject keywordsIEEE 1076.1 language
subject keywordsIEEE Std 1076-2008
subject keywordsIEEE Std 1076.1-2007
subject keywordsIEEE Std 1076.1-2017
subject keywordsIEEE standard VHDL analog and mixed-signal extensions
subject keywordsVHDL-AMS
subject keywordshardware description language
subject keywordsmixed-signal models
identifier DOI10.1109/IEEESTD.2018.8267464


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