NASA-LLIS-0771

Lessons Learned – Voltage & Temperature Margin Testing

contributor author	NASA - National Aeronautics and Space Administration (NASA)
date accessioned	2017-09-04T15:56:37Z
date available	2017-09-04T15:56:37Z
date copyright	04/11/2000
date issued	2000
identifier other	QYCEQCAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/59883
description abstract	Practice: Voltage and Temperature Margin Testing (VTMT) is the practice of exceeding the expected flight limits of voltage, temperature, and frequency to simulate the worst case functional performance, including effects of radiation and operating life parameter variations on component parts. For programs subject to severe cost or schedule constraints, VTMT has proven an acceptable alternative to conventional techniques such as worst case analysis (WCA). WCA is the preferred approach to design reliability, but VTMT is a viable alternative for flight projects where trade-offs of risk versus development time and cost are appropriate.
language	English
title	NASA-LLIS-0771	num
title	Lessons Learned – Voltage & Temperature Margin Testing	en
type	standard
page	6
status	Active
tree	NASA - National Aeronautics and Space Administration (NASA):;2000
contenttype	fulltext