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Testability Method for Embedded Core-based Integrated Circuits - IEEE Computer Society

contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2017-09-04T16:11:49Z
date available2017-09-04T16:11:49Z
date copyright03/20/2005 (R 2011)
date issued2011
identifier otherSMZOBFAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/74986
description abstractIEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.
Purpose
The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs.
IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users.
The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC.
languageEnglish
titleIEEE 1500num
titleTestability Method for Embedded Core-based Integrated Circuits - IEEE Computer Societyen
typestandard
page128
statusActive
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2011
contenttypefulltext


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