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IEEE 1232
Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-09-04T16:23:20Z | |
| date available | 2017-09-04T16:23:20Z | |
| date copyright | 40520 | |
| date issued | 2010 | |
| identifier other | TSIAIEAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/86652 | |
| description abstract | The AI-ESTATE standard defines formal specifications for supporting system diagnosis. These specifications support the exchange and processing of diagnostic information and the control of diagnostic processes. Diagnostic processes include, but are not limited to, testability analysis, diagnosability assessment, diagnostic reasoning, maintenance support, and diagnostic maturation. Purpose The AI-ESTATE standard provides formal models of diagnostic information to ensure unambiguous access to an understanding of the information supporting system testing and diagnosis. The standard defines formal information models and software services specific to several different types of diagnostic reasoners. The purpose is to provide semantically sound definitions of diagnostic knowledge and to specify software exchange and service interfaces that are consistent with the state of the practice in modern test and diagnostic systems (e.g., the use of eXtensible Markup Language [XML] and web services). | |
| language | English | |
| title | IEEE 1232 | num |
| title | Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) | en |
| type | standard | |
| page | 168 | |
| status | Active | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2010 | |
| contenttype | fulltext | |
| subject keywords | AI-ESTATE | |
| subject keywords | Bayesian Network | |
| subject keywords | diagnosis | |
| subject keywords | diagnostic inference | |
| subject keywords | diagnostic model | |
| subject keywords | diagnostic services | |
| subject keywords | D-matrix | |
| subject keywords | fault tree | |
| subject keywords | IEEE 1232 | |
| subject keywords | knowledge exchange | |
| subject keywords | system test |
