GSFC-S-311-217

SCREENING PROCEDURE FOR MICROCIRCUIT PART NO. OP-16AZ/883 (OP-AMP, PRECISION, JFET IMPUT, 8 PIN DIP)

contributor author	GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center
date accessioned	2017-09-04T15:10:56Z
date available	2017-09-04T15:10:56Z
date copyright	09/27/1983
date issued	1983
identifier other	LSRZDAAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/9287
language	English
title	GSFC-S-311-217	num
title	SCREENING PROCEDURE FOR MICROCIRCUIT PART NO. OP-16AZ/883 (OP-AMP, PRECISION, JFET IMPUT, 8 PIN DIP)	en
type	standard
page	10
status	Active
tree	GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1983
contenttype	fulltext