IEEE 101
Guide for the Statistical Analysis of Thermal Life Test Data
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-09-04T16:30:38Z | |
| date available | 2017-09-04T16:30:38Z | |
| date copyright | 09/10/1987 (R 2010) | |
| date issued | 2010 | |
| identifier other | UMLXMEAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/94028 | |
| description abstract | Introduction This revision of IEEE Std 101-1972 describes statistical analyses for data from thermally accelerated aging tests. It explains the basis and use of statistical calculations for an engineer or scientist. Statistical methods discussed in [2] 1 through [6] provide more information. Life test data analysis is dealt with more speciÞcally in [7] through [13]. The subject of this guide is treated extensively in [11] and [12]. | |
| language | English | |
| title | IEEE 101 | num |
| title | Guide for the Statistical Analysis of Thermal Life Test Data | en |
| type | standard | |
| page | 34 | |
| status | Active | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2010 | |
| contenttype | fulltext |

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