Show simple item record

Guide for the Statistical Analysis of Thermal Life Test Data

contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2017-09-04T16:30:38Z
date available2017-09-04T16:30:38Z
date copyright09/10/1987 (R 2010)
date issued2010
identifier otherUMLXMEAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/94028
description abstractIntroduction
This revision of IEEE Std 101-1972 describes statistical analyses for data from thermally accelerated aging tests. It explains the basis and use of statistical calculations for an engineer or scientist. Statistical methods discussed in [2] 1 through [6] provide more information. Life test data analysis is dealt with more speciÞcally in [7] through [13]. The subject of this guide is treated extensively in [11] and [12].
languageEnglish
titleIEEE 101num
titleGuide for the Statistical Analysis of Thermal Life Test Dataen
typestandard
page34
statusActive
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2010
contenttypefulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record