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ACCEPTANCE INSPECTION AND SCREENING PROCEDURE FOR CMOS MICROCIRCUITS (FLIGHT QUALITY - CLASS A)

contributor authorGSFC - NASA - GSFC - Robert H. Goddard Space Flight Center
date accessioned2017-09-04T17:50:47Z
date available2017-09-04T17:50:47Z
date copyright09/09/1975
date issued1975
identifier otherEXQZDAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std/handle/yse/174032
languageEnglish
titleGSFC-S-311-61num
titleACCEPTANCE INSPECTION AND SCREENING PROCEDURE FOR CMOS MICROCIRCUITS (FLIGHT QUALITY - CLASS A)en
typestandard
page6
statusActive
treeGSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1975
contenttypefulltext


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