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General Test Procedure of Failure Rate for Electronic Components

contributor authorJSA - Japanese Standards Association
date accessioned2017-09-04T18:46:32Z
date available2017-09-04T18:46:32Z
date copyright01/01/1974 (R 1982)(R 2004)
date issued2004
identifier otherKJTDFBAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std/handle/yse/227787
languageEnglish
titleJSA JIS C 5003 ERTAnum
titleGeneral Test Procedure of Failure Rate for Electronic Componentsen
typestandard
page1
statusActive
treeJSA - Japanese Standards Association:;2004
contenttypefulltext


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