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IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
IEEE Std 1658-2023 (Revision of IEEE Std 1658-2011)
Year: 2023
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Abstract: Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.
Subject: spectrum
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IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
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| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2024-12-17T08:08:41Z | |
| date available | 2024-12-17T08:08:41Z | |
| date copyright | 13 October 2023 | |
| date issued | 2023 | |
| identifier other | 10285677.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jse/handle/yse/336265 | |
| description abstract | Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs. | |
| language | English | |
| publisher | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| title | IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices | en |
| title | IEEE Std 1658-2023 (Revision of IEEE Std 1658-2011) | num |
| type | standard | |
| page | 115 | |
| status | Active | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2023 | |
| contenttype | fulltext | |
| subject keywords | spectrum | |
| subject keywords | test methods | |
| subject keywords | digital-to-analog converter | |
| subject keywords | DAC | |
| subject keywords | test terminology | |
| subject keywords | SFDR | |
| subject keywords | IEEE 1658™ | |
| subject keywords | SNR | |
| identifier DOI | 10.1109/IEEESTD.2023.10285677 |