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IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1
IEEE Std 1671.1-2017/Cor 1-2023 (Corrigendum to IEEE Std 1671.2-2017)
Year: 2024
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Abstract: Corrections to the XML Schema files to achieve full consistency with the text of the standard are addressed in this corrigendum. Additional files are also placed in the 1671 directory here: https://standards.ieee.org/wp-content/uploads/2024/04/1671.1-2017-cor1-2023-downloads.zip
Subject: test program documentation
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IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1
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| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2024-12-17T08:47:26Z | |
| date available | 2024-12-17T08:47:26Z | |
| date copyright | 26 April 2024 | |
| date issued | 2024 | |
| identifier other | 10508766.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jse/handle/yse/336475 | |
| description abstract | Corrections to the XML Schema files to achieve full consistency with the text of the standard are addressed in this corrigendum. Additional files are also placed in the 1671 directory here: https://standards.ieee.org/wp-content/uploads/2024/04/1671.1-2017-cor1-2023-downloads.zip | |
| language | English | |
| publisher | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| title | IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1 | en |
| title | IEEE Std 1671.1-2017/Cor 1-2023 (Corrigendum to IEEE Std 1671.2-2017) | num |
| type | standard | |
| page | 15 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2024 | |
| contenttype | fulltext | |
| subject keywords | test program documentation | |
| subject keywords | automatic test equipment | |
| subject keywords | ATS | |
| subject keywords | unit under test | |
| subject keywords | ATML instance document | |
| subject keywords | UUT | |
| subject keywords | XML schema | |
| subject keywords | automatic test system | |
| subject keywords | test requirements | |
| subject keywords | automatic test markup language | |
| subject keywords | ATE | |
| subject keywords | IEEE 1671.1™ | |
| subject keywords | ATML | |
| identifier DOI | 10.1109/IEEESTD.2024.10508766 |