IEC 60068-2-67
English -- Environmental Testing - Part 2: Tests - Test Cy: Damp Heat, Steady State, Accelerated Test Primarily Intended for Components - First Edition;
French -- Essais d´environnement - Partie 2: Essais - Essai Cy: Essai continu de chaleur humide, essai accelere applicable in primier lieu aux composants - First Edition
Organization:
IEC - International Electrotechnical Commission
Year: 1995
Abstract: This International Standard provides a standard test procedure for the purpose of evaluating, in an accelerated manner, the resistance of small electrotechnical products, primarily nonhermetically sealed components, to the deteriorative effect of damp heat.
The test is not intended to evaluate external effects such as corrosion and deformation.
The test is not intended to evaluate external effects such as corrosion and deformation.
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contributor author | IEC - International Electrotechnical Commission | |
date accessioned | 2017-09-04T15:44:49Z | |
date available | 2017-09-04T15:44:49Z | |
date copyright | 1995.12.01 | |
date issued | 1995 | |
identifier other | BBQSCAAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;jse/handle/yse/47224 | |
description abstract | This International Standard provides a standard test procedure for the purpose of evaluating, in an accelerated manner, the resistance of small electrotechnical products, primarily nonhermetically sealed components, to the deteriorative effect of damp heat. The test is not intended to evaluate external effects such as corrosion and deformation. | |
language | English, French | |
title | IEC 60068-2-67 | num |
title | English -- Environmental Testing - Part 2: Tests - Test Cy: Damp Heat, Steady State, Accelerated Test Primarily Intended for Components - First Edition | en |
title | French -- Essais d´environnement - Partie 2: Essais - Essai Cy: Essai continu de chaleur humide, essai accelere applicable in primier lieu aux composants - First Edition | other |
type | standard | |
page | 22 | |
status | Active | |
tree | IEC - International Electrotechnical Commission:;1995 | |
contenttype | fulltext |
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