Show simple item record

IEC 60747-18-1

contributor authorIEC - International Electrotechnical Commission
date accessioned2020-09-15T22:27:55Z
date available2020-09-15T22:27:55Z
date copyright2019.05.01
date issued2019
identifier otherLFDYHGAAAAAAAAAA.pdf
identifier otherLFDYHGAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;jsein/handle/yse/288916
description abstractScope: This part of IEC 60747 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
languageEnglish
titleEnglish -- Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors - Edition 1.0en
titleIEC 60747-18-1num
typestandard
page30
statusActive
treeIEC - International Electrotechnical Commission:;2019
contenttypefulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record