English -- Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors - Edition 1.0
IEC 60747-18-1
Organization:
IEC - International Electrotechnical Commission
Year: 2019
Abstract: Scope: This part of IEC 60747 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
Collections
:
-
Statistics
English -- Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors - Edition 1.0
Show full item record
contributor author | IEC - International Electrotechnical Commission | |
date accessioned | 2020-09-15T22:27:55Z | |
date available | 2020-09-15T22:27:55Z | |
date copyright | 2019.05.01 | |
date issued | 2019 | |
identifier other | LFDYHGAAAAAAAAAA.pdf | |
identifier other | LFDYHGAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;jsein/handle/yse/288916 | |
description abstract | Scope: This part of IEC 60747 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports. | |
language | English | |
title | English -- Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors - Edition 1.0 | en |
title | IEC 60747-18-1 | num |
type | standard | |
page | 30 | |
status | Active | |
tree | IEC - International Electrotechnical Commission:;2019 | |
contenttype | fulltext |