درباره ما
TIA TIA-455-128
Procedures for Determining Threshold Current of Semiconductor Lasers
Organization:
TIA - Telecommunications Industry Association
Year: 2007
Abstract: Introduction
Intent
Although light emission can occur as soon as current is applied to the semiconductor laser, it does nor emit coherent light until the current exceeds a critical value, known as the threshold current. The threshold current is one of the most important parameters for lasers.
This procedure provides standard measurement techniques for semiconductor lasers. This procedure covers the measurement of the threshold current of semiconductor lasers either as a laser chip placed on a surmount to facilitate handling or as an assembled laser package.
Hazards
This procedure involves potentially hazardous operations as discussed in this section. During the measurement, a laser will emit non-visible light. Personnel are strongly cautioned never to look directly into the laser at any time. Although the optical output power is generally not very high, virtually all the power is concentrated into a narrow frequency band, which implies that the energy can be focused into a very intense spot on the retina by the lens within the viewer's eyes.
Intent
Although light emission can occur as soon as current is applied to the semiconductor laser, it does nor emit coherent light until the current exceeds a critical value, known as the threshold current. The threshold current is one of the most important parameters for lasers.
This procedure provides standard measurement techniques for semiconductor lasers. This procedure covers the measurement of the threshold current of semiconductor lasers either as a laser chip placed on a surmount to facilitate handling or as an assembled laser package.
Hazards
This procedure involves potentially hazardous operations as discussed in this section. During the measurement, a laser will emit non-visible light. Personnel are strongly cautioned never to look directly into the laser at any time. Although the optical output power is generally not very high, virtually all the power is concentrated into a narrow frequency band, which implies that the energy can be focused into a very intense spot on the retina by the lens within the viewer's eyes.
Collections
:
-
Statistics
TIA TIA-455-128
Show full item record
| contributor author | TIA - Telecommunications Industry Association | |
| date accessioned | 2017-09-04T17:24:34Z | |
| date available | 2017-09-04T17:24:34Z | |
| date copyright | 39387 | |
| date issued | 2007 | |
| identifier other | CFMWBCAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsein=autho17/handle/yse/147792 | |
| description abstract | Introduction Intent Although light emission can occur as soon as current is applied to the semiconductor laser, it does nor emit coherent light until the current exceeds a critical value, known as the threshold current. The threshold current is one of the most important parameters for lasers. This procedure provides standard measurement techniques for semiconductor lasers. This procedure covers the measurement of the threshold current of semiconductor lasers either as a laser chip placed on a surmount to facilitate handling or as an assembled laser package. Hazards This procedure involves potentially hazardous operations as discussed in this section. During the measurement, a laser will emit non-visible light. Personnel are strongly cautioned never to look directly into the laser at any time. Although the optical output power is generally not very high, virtually all the power is concentrated into a narrow frequency band, which implies that the energy can be focused into a very intense spot on the retina by the lens within the viewer's eyes. | |
| language | English | |
| title | TIA TIA-455-128 | num |
| title | Procedures for Determining Threshold Current of Semiconductor Lasers | en |
| type | standard | |
| page | 25 | |
| status | Active | |
| tree | TIA - Telecommunications Industry Association:;2007 | |
| contenttype | fulltext |